Tamar Technology, inc.

Chromatic, Confocal, Non-contact, Optical Metrology. Optical Profiler. Wafer Thickness, Bow & Warp Profiler.
Applications are but not limited too:

• Non-destructive TSV & Deep Trench Measurements.
• Thickness Measurements
• SU-8 Defect Detection

For more information please visit www.tamartechnology.com